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  • Technical Program



    JUNE 10, 2009

     

     

    8:30 - 8:45

    Opening Session
    Welcome message : Sule Ozev (ASU), IMS3TW General Chair
    Program Introduction : Bozena Kaminska (SFU), IMS3TW Program Chair

     

     

    08:50 - 10:50

    SESSION 1

     

    Keynote: "Mixed-signal design automation - change you can believe in"
    Mar Hershenson, Magma-DA, USA

     

    Invited Talk: Wireless Interfacing with the Central Nervous System
    Maysam Ghovanloo, Georgia Tech, USA

     

    Mini-tutorial: A Holistic Approach to High-Speed IO BIST 
    Karim Arabi, Qualcomm, USA

     

     

    10:50 - 11:10

    Break

     

     

    11:10 – 12:30

    SESSION 2
    Chair: Andre Ivanov, UBC, Canada

     

    “General Design for Test (DfT) Guidelines for RF IC”
    Qi Fan, Qualcomm

     

    “A Versatile Technique for Evaluating Test Measurements at the Design Stage”
    Haralampos-G. Stratigopoulos, Salvador Mir and Jeanne Tongbong, TIMA, France

     

    “Demonstration of 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic”
    D.C. Keezer, C. Gray,D. Minier, P. Ducharme, Georgia Institute of Technology, Atlanta, Georgia, IBM, Bromont, Canada

     

     

    12:30 - 13:30

    Lunch

     

     

    13:30 - 15:30

    SESSION 3
    Chair: Bernard Courtois, CMP, France

     

    Invited Talk: "Cost-Effective Polymer Technologies for MEMS and Microfluidics"
    Ash Parameswaran, SFU, Canada

     

    Mini-tutorial: “MEMS in Structural Health Monitoring applications”
    Andrew Richardson, U. Lancaster, UK

     

    “A method for electrical calibration of MEMS accelerometers through multivariate regression”
    N. Dumas, F. Azaïs, F. Mailly, P. Nouet, LIRMM, CNRS/U Montpellier, France

     

     

    15:30 - 16:00

    Break

     

     

    16:00 - 17:30

    SESSION 4
    Chair: Adam Osseiran, Edith Crown U., Australia

     

    “TAC: Testing Time Reduction for Digitally-Calibrated Designs”
    Hsiu-Ming (Sherman) Chang and Kwang-Ting (Tim) Cheng, University of California, Santa Barbara, USA

     

    “Mixed-Signal Testing Using Walsh Functions”
    A. Tchegho, S. Sattler and H. Graeb, Germany

     

    “Defect-Based Analog Fault Coverage Analysis using Mixed-Mode Fault Simulation”
    Joonsung Parky, Srinadh Madhavapeddi , Alessandro Paglieri, Chris Barr and Jacob A. Abraham, University of Texas at Austin, Texas Instruments, Dallas

     

     

    17:30 - 18:30

    Free time

     

     

    18:30 - 20:30

    PANEL 1 & Reception
    Can we test heterogeneous systems?”
    Moderator: Dave C. Keezer, Georgia Tech, USA
    Organizer: Edmund Cretu, UBC, Canada

     

    Panelists:
    Ian McWalter, CMC Microsystems, Canada
    Bernard Courtois, CMP, France
    Marry Ann Maher, SoftMEMS, USA
    Ash Parameswaran, SFU, Canada
    Adam Osseiran, Edith Crown U., Australia

     

     

    JUNE 11, 2009

     

     

    8:30 – 10:00

    SESSION 5
    Chair: Haralampos-G. Stratigopoulos, TIMA, France

     

    “Using Stochastic Differential Equation for Assertion Based Verification of Noise in Analog/RF Circuits”
    Rajeev Narayanan, Mohamed H. Zaki, and Sofiene Tahar, Concordia University Montreal, Canada

     

    “BIST-Assisted Power Aware Self Healing RF Circuits”
    Shyam Kumar Devarakond, Vishwanath Natarajan, Shreyas Sen and Abhijit Chatterjee, Georgia Institute of Technology, Atlanta, GA, USA

     

    Invited Talk: “Multiple Energy Domain Simulation for Heterogeneous Systems Testing”
    Mary Ann Maher, SoftMEMS, USA

     

     

    10:00 - 10:30

    Break

     

     

    10:30 – 12:30

    PANEL 2
    ”Analog/Mixed Signal Test: Bridging the gap between AMS and digital test”
    Organizer: Sanjiv Taneja, Cadence, USA
    Moderator: Sanjiv Taneja, Cadence, USA

     

    Panelists:
    Salem Abdennadher, Intel, USA
    Tom Brennan, Advantest, USA
    Jochen Rivoir, Verigy, USA
    Jacob Abraham, University of Texas, Austin, USA

     

     

    12:30 - 13:30

    Lunch

     

     

    13:30 - 15:00

    SESSION 6
    Chair:  Florence Azais, LIRMM, CNRS/Univ. Montpellier, France

     

    “Inkjet Printing of Micro-sensors”
    Hussein Al-Chami and Edmond Cretu, UBC, Canada

     

    “Dependable Reconfigurable Multi-Sensor Poles for Security”
    Hans G. Kerkhoff, University of Twente, Enschede, the Netherlands

     

    “Design for Modular Testing of a Multilayer Flexible Wireless Multisensor Platform”
    Yindar Chuo, B. Kaminska, SFU, Canada

     

     

    15:00 - 15:30

    Break

     

     

    15:30 – 17:30

    SESSION 7
    Chair: Edmund Cretu, UBC, Canada

     

    “Accurate ADC Dynamic Testing by Means of the Three-Parameter Sine-Fit Algorithm”
    Daniel Belega, Dominique Dallet, University of Timisoara, Romania, University of Bordeaux, France

     

    “Two Improved Methods for Testing ADC Parametric Faults by Digital Input Signals”
    Xiaoqin Sheng, Hans Kerkhoff, University of Twente, the Netherlands

     

    “ADC Non-Linearity Low-Cost Test through a Simplified Double-Histogram Method”
    M. A. Jalón, E. Peralías, Spain

     

    “Vector Based Analog to Digital Converter Sequential Testing Methodology to Minimize ATE Memory and Analysis Requirements”
    Sachin Dileep Dasnurkar and Jacob A. Abraham, University of Texas at Austin, USA

     

     

    17:30 - 18:00

    Break

     

     

    18:00 – 19:30

    PANEL 3
    ”AMS/RF/sensor testing: can alternate test or BIST replace functional test? Success stories and their limitations”
    Organizer: Salvador Mir, TIMA, France
    Moderator: Ismael Rex, TI Tucson, USA

     

    Panelists:
    Karim Arabi, Qualcomm, USA
    Abhijit Chatterjee, Georgia Tech, USA
    Craig Force, TI, USA
    Hans Kerkhoff, U. Twente, Netherlands
    Haralampos Stratigopoulos, TIMA, France

     

     

    20:00

    Social event, dinner

     

     

    JUNE 12, 2009

     

     

    8:30 – 10:00

    SESSION 8
    Chair: Salvador Mir, TIMA, France

     

    “Verification of Analog and Mixed Signal Designs using On-line Monitoring”
    Hiwei Wang, Rajeev Narayanan, Naeem Abbasi,Mohamed H. Zaki, Ghiath Al Sammane, and Sofiene Tahar, Concordia University, Canada

     

    “Closed-Loop Built-in-Self-Test for PLL Production Testing with Minimal Tester Resources”
    Sachin D. Dasnurkar and Jacob A. Abraham, University of Texas at Austin

     

    “Estimation of RF PAs’ nonlinearities after cross-correlating power supply current and output voltage”
    Ricardo Veiga, José Machado da Silva, Pedro Mota, INESC Porto, Portugal

     

     

    10:00 - 10:30

    Break

     

     

    10:30 – 11:00

    SESSION 9

     

    Invited talk: “Intracortical microstimulation for creating vision : a multidisciplinary approach”
    Mohamad Sawan, Ecole Polytechnique, Montreal, Canada

     

     

    11:00 – 12:30

    SESSION 10
    Chair: Abhijit Chatterjee, Georgia Tech, USA

     

    “Reconfigurable Dielectrophoretic Device for Neurotransmitters Sensing and Manipulation”
    Mohamed Amine Miled and Mohamad Sawan, Ecole Polytechnique de Montreal, Canada

     

    “Surface Plasmon Resonance Biosensor based on Vroman Effect : Towards Cancer Biomarker Detection”
    Seokheun Choi and Junseok Chae, Arizona State University, USA

     

    “Applications for Low Frequency Impedance Analysis Systems”
    M. Giassa, A. Khosla, B. Gray, A. Parameswaran, K. Kholi, R. Rameseshan, SFU, Canada

     

     

     

    CLOSING REMARKS