One and a half decade ago the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated as a forum focused on
test and design for test issues related to systems encompassing digital and analog electrical signals. In view of
accelerated developments in heterogeneous design and production, in 2008 IMSTW started to include new topics
focusing on challenges and solutions associated with test, design for test, reliability and manufacturability of
heterogeneous types of systems in emergence or envisaged in the near to longer terms. Renamed to include sensors
and systems, the new IMS3TW aims to bring research and technical expertise for the next generation of devices,
circuits and systems. IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular
all aspects of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design
complexity (e.g., parametric variability, power consumption, temperature effects). Guaranteeing design robustness
for the new generation of nanoelectronic devices may need to exploit self-monitoring functionality (such as selftest/-
calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. Builtin
sensors can play a crucial role to facilitate device adaptability and are therefore within the scope of IMS3TW.
Primary Topics of Interest include:
| Test & Design for (on/off-line) Test |
Verification & Design for Verification |
Reliability & Design for Reliability |
Monitoring/Diagnosis & Design for Debug/Diagnosis |
Fault and Error Modelling & Simulation |
Fault Tolerance |
Pertaining to the following systems or underlying technologies:
Analog/Mixed-Signal Circuits
Biomedical Circuits & Systems |
Lab-on-Chip
MEMs |
RF & Wirelessly Controlled Devices |
Microfluidics |
Optoelectronics & Photonics |
Heterogeneous Systems |
Drug Delivery Microsystems |
Implantable Devices |
|
