One and a half decade ago,
the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated
as a forum focused on test and design for test issues related
to systems encompassing digital and analog electrical signals.
In view of accelerated developments in heterogeneous design
and production, in 2008 IMSTW will increase its scope to include
new topics focusing on challenges and solutions associated
with test, design for test, reliability and manufacturability
of heterogenous types of systems in emergence or envisaged
in the near to longer terms. Renamed to include sensors and
systems, the new IMS3TW aims to bring research and technical
expertise for the next generation of devices, circuits and
systems. IMS3TW will continue to address the traditional technology
spectrum of IMSTW, in particular all aspects of analog, mixed-signal,
and RF testing, but with increased attention to all aspects
of design complexity (e.g., increased parameter variability,
power consumption, temperature effects). Guaranteeing design
robustness for the new generation of nanoelectronic devices
may need to exploit self-monitoring functionality (such as
self-test/-calibration), allowing the circuit or system to
adapt to varying circuit parameters or functional demands.
Built-in sensors can play a crucial role to facilitate device
adaptability.
Primary Topics of Interest include:
| Test & Design for (on/off-line) Test |
Verification & Design for Verification |
Reliability & Design for Reliability |
Monitoring/Diagnosis & Design for Debug/Diagnosis |
Fault and Error Modelling & Simulation |
Fault Tolerance |
Pertaining to the following systems or underlying technologies:
Analog/Mixed-Signal Circuits
Biomedical Circuits & Systems |
Lab-on-Chip
MEMs |
RF & Wirelessly Controlled Devices |
Microfluidics |
Optoelectronics & Photonics |
Heterogeneous Systems |
Drug Delivery Microsystems |
Implantable Devices |
|
